ABNX Analytical Instruments Data Analysis Modules
1). X-Ray Diffraction (XRD) Analysis
- Peak indexing and phase identification
- Lattice parameter refinement using FullProf
- Crystallite size, density of state (DOS), PDOS, W-H plot analysis
- Electron density map
- Preferred orientation and texture analysis
- PDF fitting and comparison with standard cards (ICDD)
2). Nanoparticle Tracking Analysis (NTA)
- Particle size distribution profiles
- Concentration quantification (particles/mL)
- Comparison with DLS and image-based methods
3). Vibrating Sample Magnetometer (VSM)
- Magnetic hysteresis curve analysis (B-H/M–H plots)
- Extraction of remanence, coercivity, and saturation magnetization
- Temperature-dependent magnetic phase transition studies
4). Multiferroic System
- P-E Hysteresis loop analysis
- Investigation of magnetoelectric effects under varying external fields
- Correlation of ferroelectric and magnetic domain behavior
- Temperature-dependent multiferroic phase transition mapping
5). Scanning Electron Microscopy (SEM)
- Surface morphology analysis
- Grain size measurement using ImageJ/AI-assisted scripts
- Porosity and texture mapping
- EDS spectra interpretation for elemental profiling
6). UV–VIS–NIR Spectroscopy
- Band gap estimation via Tauc plot method
- Reflectance and transmittance curve interpretation
- Spectral integration with computational modeling (DFT-based absorption)
7). Fourier Transform Infrared Spectroscopy (FTIR)
- Functional group identification from peak regions
- Spectral fingerprinting for polymeric/biomolecular systems
- Spectral pre-processing and deconvolution techniques
- Comparative analysis of native vs. doped nanomaterials
- Spectral library development (advanced module)
8). Dynamic Light Scattering (DLS)
- Hydrodynamic diameter profiling
- Polydispersity index calculation
- Stability and zeta potential mapping
- Correlation with SEM and NTA-based data